Read Analog-Digital Simulation of Transient-Induced Logic Errors and Upset Susceptibility of an Advanced Control System - National Aeronautics and Space Administration file in ePub Online

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A simulation study is described which predicts the susceptibility of an advanced control system to electrical transients resulting in logic errors, latched errors, error propagation, and digital upset. The system is based on a custom-designed microprocessor and it incorporates fault-tolerant techniques. The system under test and the method to perform the transient

Title : Analog-Digital Simulation of Transient-Induced Logic Errors and Upset Susceptibility of an Advanced Control System
Author : National Aeronautics and Space Administration
Language : en
Rating :
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Type : PDF, ePub, Kindle
Uploaded : Apr 07, 2021

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